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郭文平

作者: 时间:2017-06-27 点击数:



职称:讲师

专业方向:光电工程系

个人简介:

电话:027-87556617

Email:wpguo@hust.edu.cn

办公地点:华中科技大学南五楼526

学习工作经历:

2012年至今:华中科技大学光学与电子信息学院担任教师工作。

2007-2012年:华中科技大学光电子科学与工程学院攻读博士学位

2003-2007年:华中科技大学光电子工程系就读本科

研究方向、领域:

光电系统设计

光电检测

机器视觉

 

主要成果:目前作为项目负责人承担自然科学基金青年项目一项,校自主创新基金一项,航天支撑基金一项,国防横向项目三项。在国际权威光学类和仪器仪表类期刊AORSIMST等杂志上发表多篇论文,申请专利6项。

1. Junwei Ye, Kecheng Yang, Hao Liu, Jie Dai, Wenping Guo, Wei Li, & Min Xia. Expand the measurement range of a critical angle refractometer by a centroid method for transparent fluids. Optics and Laser Technology, 65, 175-179. (2015)

2.Hao Liu, Junwei Ye, Kecheng Yang, Min Xia, Wenping Guo, & Wei Li. Real part of refractive index measurement approach for absorbing liquid. Applied Optics, 54(19), 6046-6052. (2015)

3.Chizhu Ding, Kecheng Yang, Wei Li, Wenping Guo, Xiaohui Zhang, & Min Xia. Application of diffraction tomography theory to determine size and shape of spheroidal particles from light scattering. Optics and Laser Technology, 62, 135-140. (2014)

4.Junwei Ye, Min Xia, Hao Liu, Wei Li, Wenping Guo, Changxin Xiong, & Kecheng Yang. Expanding the measurement range of a critical-angle refractometer through Fourier analysis. Epl, 104(2). (2013)

5.Junwei Ye, Luo Tao, Kecheng Yang, Min Xia, Wei Li, Wenping Guo, & Hao Liu. A simple accurate algorithm for the critical angle refractometer. Proceedings of SPIE: International Symposium on Photoelectronic Detection and Imaging 2013: Laser Sensing and Imaging and Applications. (2013)

6.Hao Liu, Ke-cheng Yang, Wen-Ping Guo, Jie Dai, Jun-wei Ye, Wei Li, & Min Xia. An experimental calibration method for digital Abbe refractometer. Proceedings of SPIE: International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Sensors and Applications. (2013)

7.Wenping Guo, Min Xia, Wei Li, Jie Dai, Xiaohui Zhang, & Kecheng Yang. A local curve-fitting method for the complex refractive index measurement of turbid media. Measurement Science and Technology, 23(4). (2012)

8.Wenping Guo, Gang Lu, Kecheng Yang, Min Xia, Wei Li, Jie Dai, & Xiaohui Zhang. Method of using area CCD to obtain the reflectivity curve. Proceedings of SPIE: Photonics and Optoelectronics Meetings. (2012)

9.Wenping Guo, Min Xia, Wei Li, Jie Dai, & Kecheng Yang. A two-reflection divergent differentiating critical angle refractometer. Review of Scientific Instruments, 82(5). (2011)

10.郭文平,等.一种光源分布自参照的折光计 CN104792732A.

11.郭文平,等.一种自校准的折光计 CN104777133A.

12.郭文平,等.一种快速定标模块及应用 CN104792733A.

13.夏珉, 郭文平,等.一种液体多参数传感器 CN102012359A.

 

华中科技大学  光学与电子信息学院  联系电话:027-87558726  邮编:430074 地址:中国•湖北省武汉市珞喻路1037号 华中科技大学南五楼六楼